Low-Energy Ion Scattering Spectroscopy (LEIS)

Low-Energy Ion Scattering Spectroscopy (LEIS) is one of the most surface sensitive materials charerization techniques in the world. By studying the scattered ions, it is possible to obtain information about the composition and structure of the sample. Surface sensitive charerization techniques such as LEIS are becoming increasingly important as engineering novel materials at the atomic scale would be impossible without them. Materials charerization techniques such as LEIS, XPS, SEM, AFM and more are being taught at the University of Tartu (Estonia).\r
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